LUBBOCK, TX (May 2019)  Together with Texas Tech University and PowerAmerica, Group  NIRE has begun the research and development of a Wide Band Gap (WBG) dV/dt testbed. This testbed will increase the availability of dV/dt testing and will improve future testbeds for commercial use at the Group NIRE testing facility. This effort has been focused on pushing the limits of dV/dt testing in order to test these WBG devices at the extremes that they are capable of.

Joshua MacFie, Electrical Engineer at Group NIRE, says that, “The field-reliability of Wide Bandgap (WBG) semiconductors has been challenged by high switching dV/dt stresses which have the potential to present significant switching limitations. This testing will allow WBG semiconductor producers to independently validate their devices’ switching performance against these dv/dt stresses.”

Read the Group NIRE featured article by PowerAmerica here!